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Modeling of multi-layered structure containing heterogeneous material layer with randomly distributed particles using infinite element method

机译:无限元法对包含随机分布颗粒的异质材料层的多层结构进行建模

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摘要

In the electronics industry, filler particles are added to the epoxy to form a composite material in order to adjust the elastic modulus and the coefficient of thermal expansion (CTE). This paper enhances the infinite element method (IEM) for modeling and analyzing a multi-layered structure such as flip-chip assembly containing a heterogeneous material layer reinforced with randomly distributed multiple particles under thermal loading. The proposed method provides a straightforward and efficient means of modeling multiple particles since only one IE stiffness matrix of particle needs to be calculated for all of the other particles. Moreover, in analyzing the material interface problem, the proposed technique could put many number of element layers to measure the high stresses close to the edge of the multi-layered structure, and was easily applied to compare the maximum interfacial stresses near the corner.rnA series of problems relating to multi-layered structures containing heterogeneous materials are investigated. Initially, this study investigates the effect of varying the volume fraction of randomly arranged particles in the heterogeneous layer on the effective properties of the layer. The results obtained for the effective properties of the heterogeneous material and their influence on the interfacial stress are compared to those obtained from the Mori-Tanaka analytical method. Finally, in addition to equivalent models, three-dimensional finite element models containing multiple randomly distributed particles were built and studied. It is shown that at the free edge the interfacial stresses decrease when the number of particles close to the interface increases.
机译:在电子工业中,将填料颗粒添加到环氧树脂中以形成复合材料,以便调节弹性模量和热膨胀系数(CTE)。本文增强了无限元方法(IEM),用于建模和分析多层结构,例如倒装芯片装配,其中包含在热载荷下通过随机分布的多个颗粒增强的异质材料层。由于仅需要为所有其他粒子计算一个粒子的IE刚度矩阵,因此所提出的方法提供了一种对多个粒子进行建模的直接有效的方法。此外,在分析材料界面问题时,该技术可以放置许多元素层来测量多层结构边缘附近的高应力,并且很容易应用于比较拐角附近的最大界面应力。研究了与包含异质材料的多层结构有关的一系列问题。最初,这项研究调查了改变非均质层中随机排列的颗粒的体积分数对层的有效性能的影响。将获得的非均质材料的有效特性及其对界面应力的影响的结果与通过Mori-Tanaka分析方法获得的结果进行了比较。最后,除了等效模型外,还建立并研究了包含多个随机分布粒子的三维有限元模型。结果表明,在自由边缘处,当靠近界面的颗粒数量增加时,界面应力减小。

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  • 来源
    《Microelectronics reliability》 |2010年第1期|106-115|共10页
  • 作者单位

    Department of Mechanical Engineering, National Chung Cheng University, 168, University Road, Min-Hsiung, Chia-Yi 627, Taiwan, ROC;

    Department of Mechanical Engineering, National Chung Cheng University, 168, University Road, Min-Hsiung, Chia-Yi 627, Taiwan, ROC;

    RiTdisplay Corporation, No. 12, Kuanfu N. Road, Hsin Chu Industrial Park 303, Taiwan, ROC;

    Department of Materials Science and Engineering, I-Shou University, No. 1, Section 1, Shiuecheng Road, Dashu Shiang, Kaohsiung Country 840, Taiwan, ROC;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
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