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An original DoE-based tool for silicon photodetectors EoL estimation in space environments

机译:用于太空环境中的硅光电探测器EoL估算的基于DoE的原始工具

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摘要

In our previous works we have demonstrated that Design of Experiments (DoE) is an innovative methodology defining optimized irradiation test plan and particularly valuable for the space qualification of silicon photodetectors. In particular, it provided us with the degradation model of photocurrent, darkness current, and spectral responsivity of silicon based phototransistors arrays with respect to the Total Ionizing Dose (TID) and to the Displacement Damage Dose (DDD), over a wide range of space-mission profiles. In this paper, we will summarize at first main results obtained thanks to the DoE methodology. Then we present how we can easily obtain, by exploiting DoE collected data, End-of-Iife predictions of such devices with a reduced number of experiments, with a small batch of devices, and in relatively short time.
机译:在我们以前的工作中,我们已经证明实验设计(DoE)是一种创新的方法,可以定义优化的辐照测试计划,并且对于硅光电探测器的空间鉴定特别有价值。特别是,它为我们提供了基于硅的光电晶体管阵列在较大空间范围内相对于总电离剂量(TID)和位移损伤剂量(DDD)的光电流,暗电流和光谱响应度的退化模型。任务配置文件。在本文中,我们将首先总结通过DoE方法获得的主要结果。然后,我们介绍了如何通过利用DoE收集的数据,以较少的实验次数,一小批设备并且在相对较短的时间内,轻松地获得此类设备的Iife预测。

著录项

  • 来源
    《Microelectronics reliability》 |2011年第11期|p.1999-2003|共5页
  • 作者单位

    Laboratoire IMS, Universite de Bordeaux, 351 Cours Liberation, 33405 Tatence Cedex, France;

    Laboratoire IMS, Universite de Bordeaux, 351 Cours Liberation, 33405 Tatence Cedex, France;

    CNES, 18 Avenue Edouard Belin, 31401 Toulouse Cedex 4, France;

    CNES, 18 Avenue Edouard Belin, 31401 Toulouse Cedex 4, France;

    Laboratoire IMS, Universite de Bordeaux, 351 Cours Liberation, 33405 Tatence Cedex, France;

    DIEE, Universitd degli Studi di Cagliari, piazza d'Armi, 09123 Cagliari, Italy;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
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