首页> 外文期刊>Microelectronics reliability >A model for length of saturation velocity region in double-gate Graphene nanoribbon transistors
【24h】

A model for length of saturation velocity region in double-gate Graphene nanoribbon transistors

机译:双栅石墨烯纳米带晶体管的饱和速度区域长度模型

获取原文
获取原文并翻译 | 示例
           

摘要

Length of saturation region (LVSR) as an important parameter in nanoscale devices, which controls the drain breakdown voltage is in our focus. This paper presents three models for surface potential, surface electric field and LVSR in double-gate Graphene nanoribbon transistors. The Poisson equation is used to derive surface potential, lateral electric field and LVSR. Using the proposed models, the effect of several parameters such as drain-source voltage, oxide thickness, doping concentration and channel length on the LVSR is studied.
机译:饱和区长度(LVSR)作为纳米级器件中的重要参数,它是控制漏极击穿电压的重点。本文提出了三种模型的双栅极石墨烯纳米带晶体管的表面电势,表面电场和LVSR。泊松方程用于导出表面电势,横向电场和LVSR。使用所提出的模型,研究了漏极-源极电压,氧化物厚度,掺杂浓度和沟道长度等几个参数对LVSR的影响。

著录项

  • 来源
    《Microelectronics reliability》 |2011年第12期|p.2143-2146|共4页
  • 作者单位

    School of Electrical and Electronic Engineering, Engineering Campus, Universiti Sains Malaysia, Penang, Malaysia;

    Department of Computer Engineering, Ashtian Branch, Islamic Azad University, Ashtian, Iran;

    Department of Electronic Engineering, Faculty of Electrical Engineering, Universiti Teknologi Malaysia, 81310 Skudaijohor Darul Takzim, Malaysia;

    School of Electrical and Electronic Engineering, Engineering Campus, Universiti Sains Malaysia, Penang, Malaysia;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号