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Improving an LDMOST by variation of lateral doping on epitaxial-layer drift region

机译:通过改变外延层漂移区上的横向掺杂来改善LDMOST

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摘要

Variation of lateral doping (VLD) is applied to the epitaxial-layer drift region in LDMOSTs, resulting in non-uniform doping concentration. In addition to a decrease in on-resistance, it improves electric field distribution on the surface of drift region, and thus increases the breakdown voltage. We studied the condition of using the VLD technique, and compared it with the conventional technique of optimizing the epitaxial-layer uniform concentration. Results from TSPUREM 4 and MEDICI simulations indicate that when the epitaxial-layer doping concentration is 1.5×10~(15)cm~(-3), applying VLD to the drift region increases the breakdown voltage by as much as 34% (187-251 V), while the specific on-resistance is lowered by 55% (49-22 mil cm~2), which are remarkable improvements. On the other hand, if the doping concentration of epitaxial-layer is already high, the improvement of applying VLD is limited.
机译:横向掺杂(VLD)的变化应用于LDMOSTs中的外延层漂移区,导致掺杂浓度不均匀。除了减小导通电阻之外,它还改善了漂移区表面上的电场分布,从而增加了击穿电压。我们研究了使用VLD技术的条件,并将其与优化外延层均匀浓度的常规技术进行了比较。 TSPUREM 4和MEDICI仿真结果表明,当外延层掺杂浓度为1.5×10〜(15)cm〜(-3)时,将VLD应用于漂移区可使击穿电压增加34%(187- 251 V),而比导通电阻降低了55%(49-22 mil cm〜2),这是显着的改进。另一方面,如果外延层的掺杂浓度已经很高,则施加VLD的改进受到限制。

著录项

  • 来源
    《Microelectronics reliability 》 |2011年第12期| p.2059-2063| 共5页
  • 作者

    Yang-Hua Chang; Chia-Hao Chang;

  • 作者单位

    Department of Electronic Engineering, National Yunlin University of Science & Technology. Taiwan, ROC;

    Department of Electronic Engineering, National Yunlin University of Science & Technology. Taiwan, ROC;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

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