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LTCC package for high temperature applications

机译:用于高温应用的LTCC封装

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摘要

There is a growing demand for sensors and electronics that can work in harsh environments and at high temperature. Applications include sensors and actuators for control in petroleum and geothermal industry, process monitoring and distributed control systems in the automotive and aerospace fields. Process development and packaging materials for electronic devices are closely connected to such packaging issues. In many cases the package is as important as the device itself in meeting the applications needs. Low temperature co-fired ceramics (LTCC) and thick-film technologies have the potential to incorporate multilayer structures, enabling fabrication of specialized packaging systems. LTCC technology enables easy electrical or optical connections within and between layers in addition to enabling use of integrated passive components, heaters, sensors, converters etc. This paper presents attempts to develop a reliable packaging technology for silicon carbide (SiC) based hydrogen sensors operating at temperatures up to 300 ℃ Some simulations of thermal properties were carried out and package structures were made and investigated. The package protects the sensor against mechanical damage and makes possible easy electrical connections. Moreover, the heater and temperature sensors allow for proper temperature regulation of the element. The manufacturing process, basic electrical parameters of the integrated heater as well as real temperature distribution are presented.
机译:对于可以在恶劣环境和高温下工作的传感器和电子设备的需求不断增长。应用范围包括用于石油和地热行业控制的传感器和执行器,汽车和航空航天领域的过程监控和分布式控制系统。电子设备的工艺开发和包装材料与此类包装问题密切相关。在许多情况下,包装对于满足应用程序需求与设备本身一样重要。低温共烧陶瓷(LTCC)和厚膜技术具有整合多层结构的潜力,可以制造专门的包装系统。 LTCC技术除了可以使用集成的无源元件,加热器,传感器,转换器等之外,还可以在层内和层之间实现简单的电气或光学连接。本文提出了尝试开发一种可靠的封装技术,用于在以下温度下工作的基于碳化硅(SiC)的氢传感器温度高达300℃进行了一些热性能模拟,并制作和研究了包装结构。该包装可保护传感器免受机械损坏,并使电气连接变得容易。此外,加热器和温度传感器允许对元件进行适当的温度调节。介绍了制造过程,集成加热器的基本电参数以及实际温度分布。

著录项

  • 来源
    《Microelectronics reliability 》 |2011年第7期| p.1241-1244| 共4页
  • 作者

    Damian Nowak; Andrzej Dziedzic;

  • 作者单位

    Wroclaw University of Technology, Faculty of Microsystem Electronics and Photonics, Janiszewskiego 11/17, 50-372 Wroclaw, Poland;

    Wroclaw University of Technology, Faculty of Microsystem Electronics and Photonics, Janiszewskiego 11/17, 50-372 Wroclaw, Poland;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

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