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LDMOSFET with drain potential suppression for 100 V Power IC technology

机译:具有漏极电位抑制功能的LDMOSFET,用于100 V电源IC技术

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摘要

A standard 0.35 micrometer CMOS technology has been extended for 100 V Power IC applications by accommodating reduced surface field (RESURF) LDMOSFET device with p-well block region or extended poly-overlap region for suppression of the drain wrapping potential. A 100 V integrated H-bridge circuit suitable for driving a brushless DC motor has been designed, manufactured and tested to prove the technology. To streamline the design and integration of this power device 2D and 3D simulations have been performed. Different electrical isolation schemes to provide technology compartmentalization have also been investigated experimentally and results are discussed.
机译:标准的0.35微米CMOS技术已经扩展到100 V功率IC应用,通过容纳具有p阱块区或扩展的多重叠区的减小表面场(RESURF)LDMOSFET器件来抑制漏极包裹电位。已经设计,制造和测试了适用于驱动无刷直流电动机的100 V集成H桥电路,以证明该技术。为了简化该功率器件的设计和集成,已经执行了2D和3D仿真。还通过实验研究了提供技术隔离的不同电隔离方案,并讨论了结果。

著录项

  • 来源
    《Microelectronics reliability》 |2011年第3期|p.529-535|共7页
  • 作者单位

    School of Engineering, Swansea University, Singleton Park, Swansea SA2 8PP, United Kingdom;

    School of Engineering, Swansea University, Singleton Park, Swansea SA2 8PP, United Kingdom;

    X-FAB UK Ltd., United Kingdom;

    X-FAB UK Ltd., United Kingdom;

    Diodes - ZETEX, Chadderton, Oldham 0L9 9LL, United Kingdom;

    Diodes - ZETEX, Chadderton, Oldham 0L9 9LL, United Kingdom;

    School of Engineering, Swansea University, Singleton Park, Swansea SA2 8PP, United Kingdom;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

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