...
首页> 外文期刊>Microelectronics reliability >Room temperature wedge-wedge ultrasonic bonding using aluminum coated copper wire
【24h】

Room temperature wedge-wedge ultrasonic bonding using aluminum coated copper wire

机译:使用镀铝铜线的室温楔形楔形超声焊接

获取原文
获取原文并翻译 | 示例
   

获取外文期刊封面封底 >>

       

摘要

The purpose of this work is to evaluate the feasibility of room temperature wedge-wedge bonding using commercially available copper wires, coated with aluminum. Bonding quality, reliability and aging resistance of the wire bonds have been investigated using standard wire pull tests immediately after bonding and after accelerated life tests, including temperature storage at 125 ℃, 150℃, and 200 ℃ for up to 2000 h. Using focused ion beam (FIB-) preparation and high resolution electron microscopy (SEM, TEM combined with EDX X-ray analysis), results of microstructure investigations of the Al-coating/Cu wire interface as well as of the bonding interconnect formed between the coated wire and the metallization on ceramic substrate will be presented. These investigations provide background information regarding the binding mechanisms and material interactions, and contribute to assess and to avoid potential reliability risks. Due to the found advantageous bond processing behavior and increased reliability properties, our results indicate that room temperature wedge-wedge bonding of coated copper wires has a remarkable application potential, for instance in medical and other high reliability as well as high power applications. It combines all known advantages of usual copper bonding like excellent contacting behavior, high reliability and favorable material price with the possibility of processing temperature damageable components and considerable improved storage capability. Therefore, room temperature bonding using coated copper wire can also reduce cycle time, manufacturing and material costs.
机译:这项工作的目的是评估使用可商购的涂有铝的铜线进行室温楔形楔焊的可行性。紧接键合后和加速寿命试验后,使用标准的导线拉力试验研究了线键合的键合质量,可靠性和耐老化性,包括在125℃,150℃和200℃的温度下存储长达2000小时。使用聚焦离子束(FIB-)制备和高分辨率电子显微镜(SEM,TEM与EDX X射线分析相结合),研究了Al涂层/ Cu导线界面以及形成于涂层之间的键合互连的微观结构。将介绍涂层导线和在陶瓷基板上的金属化。这些调查提供了有关绑定机制和材料相互作用的背景信息,并有助于评估和避免潜在的可靠性风险。由于发现了有利的键合加工性能和更高的可靠性,我们的结果表明,镀铜铜线的室温楔形楔形键合具有显着的应用潜力,例如在医疗和其他高可靠性以及高功率应用中。它结合了常规铜键合的所有已知优点,例如出色的接触性能,高可靠性和有利的材料价格,并具有加工温度可损坏的组件的可能性以及显着提高的存储能力。因此,使用涂覆铜线的室温键合还可以减少周期时间,制造和材料成本。

著录项

  • 来源
    《Microelectronics reliability》 |2011年第1期|p.97-106|共10页
  • 作者单位

    Micro Systems Engineering GmbH, Schlegelweg 17, D-95180 Berg/Oberfranken, Germany;

    Fraunhofer Institute for Mechanics of Materials 1WM, Walter-Htilse-StraJSe I, D-06120 Halle, Germany;

    Fraunhofer Institute for Mechanics of Materials 1WM, Walter-Htilse-StraJSe I, D-06120 Halle, Germany;

    Micro Systems Engineering GmbH, Schlegelweg 17, D-95180 Berg/Oberfranken, Germany;

    Technical University Dresden, Electronics Packaging Laboratory IAVT, HelmholtzstraJSe 10, D-01069 Dresden, Germany;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号