首页> 外文期刊>Microelectronics reliability >Fine pitch copper wire bonding in high volume production
【24h】

Fine pitch copper wire bonding in high volume production

机译:大批量生产中的细间距铜线键合

获取原文
获取原文并翻译 | 示例

摘要

Wire bonding is the predominant mode of interconnection in electronic packaging. Gold wire bonding has been refined again and again to retain control of interconnect technology due to its ease of workability and years of reliability data. Economic realities are now enabling fine diameter copper wire to compete with gold wire. It needs to be demonstrated however that known challenges in the assembly process and long term reliability can be managed successfully. Here, a rigorous methodology has been established to introduce copper wire bonding on new as well as converted dice into manufacturing. Manufacturing efficiencies and yields have been driven to be equivalent to gold wires. Reliability testing has passed the usual criteria and has been extended to demonstrate the viability of this technology. Interfacial analysis has confirmed the observations that intermetallic compounds form and grow slowly.
机译:引线键合是电子封装中互连的主要方式。由于金线键合的易用性和多年的可靠性数据,它一次又一次地精炼以保持对互连技术的控制。经济现实使细径铜线能够与金线竞争。然而,需要证明的是,组装过程中已知的挑战和长期可靠性可以得到成功管理。在这里,已经建立了严格的方法,以将铜线键合引入到新的以及转换后的晶粒上以进行制造。制造效率和良率已被驱动为等同于金线。可靠性测试已通过通常的标准,并已扩展为证明该技术的可行性。界面分析证实了金属间化合物形成并生长缓慢的观察结果。

著录项

  • 来源
    《Microelectronics reliability》 |2011年第1期|p.13-20|共8页
  • 作者单位

    ASE Croup, 3590 Peterson Way, Santa Clara, CA 95054, USA;

    ASE Croup, 3590 Peterson Way, Santa Clara, CA 95054, USA;

    ASE Croup, 26 Chin 3rd Rd., Nantze Export Zone, Kaohsiung 81170, Taiwan;

    ASE Croup, 26 Chin 3rd Rd., Nantze Export Zone, Kaohsiung 81170, Taiwan;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号