...
首页> 外文期刊>Microelectronics & Reliability >Harsh environment application of electronics - Reliability of copper wiring and testability thereof
【24h】

Harsh environment application of electronics - Reliability of copper wiring and testability thereof

机译:电子的恶劣环境应用-铜线的可靠性及其可测试性

获取原文
获取原文并翻译 | 示例

摘要

Harsh environment imposes different and more severe operational demands to electronic devices. Besides loads as temperature and vibration, also chemical loads in contact to electronics, can lead to new types of failure, e.g. by corrosion. With regard to reliability demands, testability thereof becomes more and more important. This implies activation energies for copper corrosion, which were determined. A model is proposed in order to gain more understanding of the ongoing chemical processes between the electronic control unit and transmission fluid.
机译:恶劣的环境对电子设备提出了不同且更加严格的操作要求。除了温度和振动负载外,与电子设备接触的化学负载还会导致新型故障,例如:通过腐蚀。关于可靠性要求,其可测试性变得越来越重要。这意味着已确定了用于铜腐蚀的活化能。为了更好地理解电子控制单元和变速箱油之间正在进行的化学过程,提出了一个模型。

著录项

  • 来源
    《Microelectronics & Reliability》 |2012年第10期|p.2452-2456|共5页
  • 作者单位

    Robert Bosch GmbH, Corporate Research, Schwieberdingen, Germany,Institute of Microsystems Technology (IMTEK). University of Freiburg, Germany;

    Robert Bosch GmbH, Corporate Research, Schwieberdingen, Germany;

    Robert Bosch GmbH, Corporate Research, Schwieberdingen, Germany;

    Robert Bosch GmbH, Corporate Research, Schwieberdingen, Germany;

    Institute of Microsystems Technology (IMTEK). University of Freiburg, Germany;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号