Reliability estimation with uncertainties consideration for high power IGBTs in 2.3 MW wind turbine converter system

摘要

This paper investigates the lifetime of high power IGBTs (insulated gate bipolar transistors) used in large wind turbine applications. Since the IGBTs are critical components in a wind turbine power converter, it is of great importance to assess their reliability in the design phase of the turbine. Minimum, maximum and average junction temperatures profiles for the grid side IGBTs are estimated at each wind speed input values. The selected failure mechanism is the crack propagation in solder joint under the silicon die. Based on junction temperature profiles and physics of failure model, the probabilistic and determinist damage models are presented with estimated fatigue lives. Reliably levels were assessed by means of First Order Reliability Method taking into account uncertainties.