首页> 外文期刊>Microelectronics reliability >Fault model for on-chip communication and joint equalization and special spacing rules for on-chip bus design
【24h】

Fault model for on-chip communication and joint equalization and special spacing rules for on-chip bus design

机译:片上通信的故障模型,联合均衡以及片上总线设计的特殊间距规则

获取原文
获取原文并翻译 | 示例
           

摘要

Achieving high speed and reliability is a key challenge in on-chip bus design. To address the challenge, in this paper we propose a fault model for on-chip communication and further develop a new joint scheme which integrates an equalization technique and special spacing rules for improving the speed and communication reliability for on-chip buses. The proposed equalizer employs a variable threshold inverter whose switching threshold is adjusted as a function of the past output of the buses to achieve high-speed and high-reliability of the buses. Special spacing rules use the sufficient spacing between the adjacent wires to mitigate the crosstalk effect from the adjacent wires. The joint scheme equalization and special spacing rules exploits their respective advantages to further improve the speed and communication reliability of the buses. The simulation results show that the joint scheme equalization and increasing spacing of the uncoded bus can reduce 50% delay and save 42% power only with 52% area overhead compared with the minimum-spaced uncoded bus. The bit error rate of the bus can be improved from 10~(-5) to 10~(-24).
机译:实现高速和可靠性是片上总线设计中的关键挑战。为了解决这一挑战,本文提出了一种片上通信的故障模型,并进一步开发了一种新的联合方案,该方案结合了均衡技术和特殊的间隔规则,以提高片上总线的速度和通信可靠性。所提出的均衡器采用可变阈值逆变器,该可变阈值逆变器的开关阈值根据总线的过去输出进行调节,以实现总线的高速和高可靠性。特殊的间距规则使用相邻导线之间的足够间距来减轻来自相邻导线的串扰影响。联合方案均衡和特殊间距规则利用它们各自的优点来进一步提高总线的速度和通信可靠性。仿真结果表明,与最小间隔的未编码总线相比,联合方案均衡和增加未编码总线的间距可以减少50%的延迟,并仅以52%的面积开销节省42%的功率。总线的误码率可以从10〜(-5)提高到10〜(-24)。

著录项

  • 来源
    《Microelectronics reliability》 |2012年第6期|p.1241-1246|共6页
  • 作者

    LeiLi; Jianhao Hu;

  • 作者单位

    Research Institute of Electronic Science and Technology, University of Electronic Science and Technology of China, No. 2006, Xiyuan Avenue, High-Tech West Zone,Chengdu 611731, China;

    National Key Laboratory of Science and Technology on Communication, University of Electronic Science and Technology of China, No. 2006, Xiyuan Avenue, High-Tech West Zone,Chengdu 611731, China;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号