...
首页> 外文期刊>Microelectronics reliability >Lifetime prediction modeling of non-insulated TO-220AB packages with lead-based solder joints during power cycling
【24h】

Lifetime prediction modeling of non-insulated TO-220AB packages with lead-based solder joints during power cycling

机译:功率循环期间具有铅基焊点的非绝缘TO-220AB封装的寿命预测模型

获取原文
获取原文并翻译 | 示例
   

获取外文期刊封面封底 >>

       

摘要

In this paper, a physical model is proposed to estimate the TRIAC solder joint fatigue during power cycling. The lifetime prediction is based on the following assumptions: the case temperature swing (△T_(case)) is the main acceleration factor, the solder joints are the weakest materials in the non-insulated TO-220AB TRIAC package and the plastic strain within the solder layer due to shearing is the failure cause.
机译:在本文中,提出了一种物理模型来估计功率循环期间的TRIAC焊点疲劳。寿命预测基于以下假设:外壳温度波动(△T_(case))是主要的加速因子,焊点是非绝缘TO-220AB TRIAC封装中最弱的材料,并且封装中的塑性应变焊料层由于剪切作用是失效的原因。

著录项

  • 来源
    《Microelectronics reliability》 |2012年第1期|p.212-216|共5页
  • 作者单位

    STMicroelectronics, 16 rue Pierre et Marie Curie, BP 7155, 37071 Tours Cedex 2, France,Power Microelectronics Laboratory (IMP), Tours University, France;

    Power Microelectronics Laboratory (IMP), Tours University, France;

    Power Microelectronics Laboratory (IMP), Tours University, France;

    Power Microelectronics Laboratory (IMP), Tours University, France;

    Mechanics and Rheology Laboratory (LMR), Tours University, France;

    STMicroelectronics, 16 rue Pierre et Marie Curie, BP 7155, 37071 Tours Cedex 2, France,Power Microelectronics Laboratory (IMP), Tours University, France;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号