首页> 外文期刊>Microelectronics reliability >On the use of high-impedance power supplies to reduce the substrate switching noise in system-on-chips
【24h】

On the use of high-impedance power supplies to reduce the substrate switching noise in system-on-chips

机译:关于使用高阻抗电源来减少片上系统中的基板开关噪声

获取原文
获取原文并翻译 | 示例

摘要

This paper analyzes the generation and the propagation in system-on-chips of the switching noise due to embedded core logic blocks. Such disturbances contribute to degrade the performance of the other on-chip circuits and cause unwanted electromagnetic emission. These parasitic effects can be largely ascribed to the steep currents that flow into the power supply interconnects of the core logic blocks and to the parasitic coupling of the system-on-chip building blocks through the silicon substrate they share.In this work it is shown that the substrate voltage bounce due to the switching noise can be significantly attenuated if conventional low-impedance DC power supplies are replaced by high-impedance one. The effectiveness of the proposed approach is validated through computer simulations and experimental tests carried out on the digital core block of a test chip.
机译:本文分析了由于嵌入式核心逻辑模块导致的开关噪声在芯片上的产生和传播。此类干扰会导致其他片上电路的性能下降,并导致有害的电磁辐射。这些寄生效应可以很大程度上归因于流入核心逻辑模块的电源互连的陡峭电流以及通过它们共享的硅衬底的片上系统构建模块的寄生耦合。如果将传统的低阻抗直流电源替换为高阻抗电源,则可以显着降低由开关噪声引起的基板电压反弹。通过在测试芯片的数字核心模块上进行的计算机仿真和实验测试,验证了该方法的有效性。

著录项

  • 来源
    《Microelectronics reliability》 |2012年第1期|p.282-288|共7页
  • 作者

    F. Fiori;

  • 作者单位

    Microelectronics EMC Croup. Eln. Dpi, Politecnico di Torino Cso Duca degli Abruzzi 24, 10128 Turin, Italy;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号