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首页> 外文期刊>Microelectronics reliability >Enhancement of electrical stability of anisotropic conductive film (ACF) interconnections with viscosity-controlled and high T_g ACFs in fine-pitch chip-on-glass applications
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Enhancement of electrical stability of anisotropic conductive film (ACF) interconnections with viscosity-controlled and high T_g ACFs in fine-pitch chip-on-glass applications

机译:在细间距玻璃上芯片应用中,通过粘度控制和高T_g ACF增强各向异性导电膜(ACF)互连的电稳定性

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摘要

This paper describes how anisotropic conductive film (ACF) properties including viscosity affect the electrical stability of ACF interconnections for fine pitch chip-on-glass (COG) applications. In this study, new ACFs for COG applications were designed by combining a high viscosity ACF layer and a low viscosity NCF layer to prevent the electrical shortage between bumps. As expected, the viscosity-controlled ACF showed better electrical insulation stability than a conventional ACF in fine pitch COG assemblies. According to the results of thermo-mechanical analysis (TMA) and dynamic-mechanical analysis (DMA), the viscosity-controlled ACF showed the improved thermo-mechanical properties such as lower coefficient of thermal expansion (CTE), higher storage modulus (F) at higher temperature region, and higher glass transition temperature (T_g) than the conventional ACF. Furthermore, hot air reliability test and pressure cooker test (PCT) results showed that the viscosity-controlled ACF with higher T_g had better hot air test and PCT reliabilities than the conventional ACF.
机译:本文介绍了各向异性导电膜(ACF)的特性(包括粘度)如何影响用于精细间距玻璃上芯片(COG)应用的ACF互连的电稳定性。在这项研究中,通过结合高粘度ACF层和低粘度NCF层来设计用于COG的新型ACF,以防止凸块之间的电短路。如预期的那样,在细间距COG组件中,粘度控制的ACF显示出比常规ACF更好的电绝缘稳定性。根据热机械分析(TMA)和动态机械分析(DMA)的结果,粘度控制的ACF具有改善的热机械性能,例如较低的热膨胀系数(CTE),较高的储能模量(F)与常规ACF相比,在更高的温度区域具有更高的玻璃化转变温度(T_g)。此外,热空气可靠性测试和压力锅测试(PCT)结果表明,具有较高T_g的粘度控制的ACF具有比常规ACF更好的热空气测试和PCT可靠性。

著录项

  • 来源
    《Microelectronics reliability》 |2012年第1期|p.217-224|共8页
  • 作者单位

    Dept. of Materials Science and Engineering, Korea Advanced Institute of Science & Technology, 373-1, Cu-seong dong, Yu-seong gu, Daejeon 305-701, Republic of Korea;

    H&S HighTech Corp., 166-5, Shintanjin dong, Dedeok gu, Daejeon 306-816, Republic of Korea;

    H&S HighTech Corp., 166-5, Shintanjin dong, Dedeok gu, Daejeon 306-816, Republic of Korea;

    H&S HighTech Corp., 166-5, Shintanjin dong, Dedeok gu, Daejeon 306-816, Republic of Korea;

    Dept. of Materials Science and Engineering, Korea Advanced Institute of Science & Technology, 373-1, Cu-seong dong, Yu-seong gu, Daejeon 305-701, Republic of Korea;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 eng
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