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机译:InGaZnO薄膜晶体管在正栅极应力和热载流子应力下器件退化的比较研究
Department of Electronics Engineering, University of Incheon, #119 Academi-Ro Yoonsu-Gu, Incheon 406-772, Republic of Korea;
Department of Electronics Engineering, University of Incheon, #119 Academi-Ro Yoonsu-Gu, Incheon 406-772, Republic of Korea;
Department of Electronics Engineering, University of Incheon, #119 Academi-Ro Yoonsu-Gu, Incheon 406-772, Republic of Korea;
Department of Electronics Engineering, University of Incheon, #119 Academi-Ro Yoonsu-Gu, Incheon 406-772, Republic of Korea;
机译:InGaZnO薄膜晶体管在不同环境下的栅极偏置应力和热载流子应力引起的不稳定性研究
机译:热载体应力和照明下蚀刻 - 止挡层结构化A-Imazno薄膜晶体管的劣化行为
机译:a-InGaZnO薄膜晶体管在热载流子应力下高温诱导的亚阈值摆幅和导通电流退化的异常抑制
机译:InGaZnO薄膜晶体管在交流闸门偏置应力作用下在止蚀层处电荷陷获引起的降解研究
机译:InGaZnO薄膜晶体管的后处理,以改善偏置照明应力的可靠性。
机译:钝化层对非晶InGaZnO薄膜晶体管正栅极偏置-应力稳定性的影响
机译:出版商的注意事项:“界面过量氧对自排列共青薄膜薄膜晶体管的正偏压稳定性的影响”苹果酱。物理。吧。 108,141604(2016)