Conducted and radiated EMI evolution of power RF N-LDMOS after accelerated ageing tests

摘要

The electromagnetic compatibility (EMC) study is an indispensable step in the power system development cycle components. In this paper, we present a study on the evolution of conducted (in common and differential mode voltages) and radiated interferences generated by a static converter after various accelerated ageing tests (thermal and electrical) of the power switching RF N-LDMOS devices. Experimental results are presented and analyzed. We notice a clear increase in the amplitude of resonances in the interference spectra after ageing tests.