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机译:双向电迁移失败
Globalfoundries, Singapore Pte Ltd., 60 Woodlands Ind Park, 738406 Singapore, Singapore,School of Materials Science and Engineering, Nanyang Technological University, 639798 Singapore, Singapore;
School of Electronic, Electrical and Systems Engineering, Loughborough University, UK;
School of Materials Science and Engineering, Nanyang Technological University, 639798 Singapore, Singapore;
School of Electronic, Electrical and Systems Engineering, Loughborough University, UK;
机译:双向电流应力下电迁移失效的建模与表征
机译:脉冲和双向电流应力下互连的电迁移失效模型
机译:如何识别电迁移:电迁移历史和故障分析
机译:带有ENEPIG垫层的Cu柱互连的电迁移早期故障及其抑制
机译:用于ULSI应用的IC金属化系统和铜金属化中电迁移故障的建模和表征。
机译:铜双镶嵌互连的早期电迁移失败的紧凑模型
机译:双向电迁移修复三乙烯四胺对氯化物污染混凝土的有机缓蚀剂