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Benefits of field failure distribution modeling to the failure analysis

机译:现场故障分布建模对故障分析的好处

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摘要

The automotive components are newly subjected to safety requirements that are defined in particular by the ISO26262 standard. Meanwhile, customers request risk assessments or prediction studies on the number of failures expected in the field. These requirements from the ISO26262 standard and from customers lead component manufacturers to study new methods of failure rate estimation, in particular from field results. In this article, field failure distribution modeling with a typical Weibull model and its benefits for integrated circuit failure analysis are presented. Three case studies are detailed, in which the results obtained by the field modeling allowed to discriminate a failure by its Weibull parameters, to study the influence of application on the failure occurrence and the possibility to predict a quality crisis.
机译:汽车部件新近受到了安全要求,这些要求特别由ISO26262标准定义。同时,客户要求对现场预期发生的故障数量进行风险评估或预测研究。 ISO26262标准和客户的这些要求导致组件制造商研究故障率估计的新方法,特别是根据现场结果。在本文中,提出了具有典型威布尔模型的现场故障分布建模及其对集成电路故障分析的好处。详细介绍了三个案例研究,其中通过现场建模获得的结果允许通过其Weibull参数来区分故障,以研究应用对故障发生的影响以及预测质量危机的可能性。

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  • 来源
    《Microelectronics & Reliability 》 |2013年第11期| 1194-1198| 共5页
  • 作者

    C. Berges; J. Goxe;

  • 作者单位

    Product Analysis Laboratory, Freescale Semiconductor SAS. 134 Av General Eisenhower, BP 72329. 3W23 Toulouse Cedex 1, France;

    Product Analysis Laboratory, Freescale Semiconductor SAS. 134 Av General Eisenhower, BP 72329. 3W23 Toulouse Cedex 1, France;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

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