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Fretting corrosion: Analysis of the failure mechanism for low voltage drives applications

机译:微动腐蚀:分析低压驱动器的故障机理

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摘要

In many power electronics products, such as low voltage LV motor drives, the mechanical and electrical connection between printed circuit board assemblies (PCBAs) is obtained though board-to-board connectors. A common failure mechanism for these components is fretting corrosion. This failure mechanism results from mechanical micro-motion of two parts with respect to each other and causes a wear damage at the asperities of the contact surface resulting in an increase of the ohmic resistance which finally triggers various device failures. Failures resulting from interrupted communication path may create different effects at the product level depending on the power electronic circuit diagram. In this paper investigation on fretting corrosion on board-to-board connectors was performed. The chemical composition and microstructural analysis at the junction part of the connectors were performed for as new samples and after aging testing which includes stressors like humidity, temperature, temperature cycling and vibration. Scanning Electron Microscopy (SEM) and energy dispersive X-ray analysis (EDX) showed aging effect on the intermetallic compound (IMC) material correlated to intermetallic growth and oxidation.
机译:在许多电力电子产品中,例如低压LV电机驱动器,通过板对板连接器可实现印刷电路板组件(PCBA)之间的机械和电气连接。这些组件的常见故障机制是微动腐蚀。这种失效机理是由于两部分相互之间的机械微动而引起的,并且在接触表面的凹凸处造成磨损损坏,从而导致欧姆电阻的增加,最终引发各种设备故障。取决于功率电子电路图,由于通信路径中断而导致的故障可能在产品级别产生不同的影响。在本文中,对板对板连接器的微动腐蚀进行了研究。对连接器的连接部分的化学成分和微观结构进行了分析,以作为新样品,并在老化测试后进行了老化测试,其中包括诸如湿度,温度,温度循环和振动之类的压力源。扫描电子显微镜(SEM)和能量色散X射线分析(EDX)显示,金属间化合物(IMC)材料的老化效应与金属间的生长和氧化有关。

著录项

  • 来源
    《Microelectronics & Reliability》 |2014年第10期|2109-2114|共6页
  • 作者单位

    ABB Switzerland Ltd., Corporate Research, Segelhofstrasse 1K, 5405 Baden-Daettwil, Switzerland;

    ABB Switzerland Ltd., Corporate Research, Segelhofstrasse 1K, 5405 Baden-Daettwil, Switzerland;

    Tampere University of Technology, Department of Electrical Engineering, 692,33101 Tampere, Finland;

    Tampere University of Technology, Department of Electrical Engineering, 692,33101 Tampere, Finland;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    Connectors reliability; Frequency motor drive; Fretting corrosion; SEM-EDX;

    机译:连接器可靠性;变频电机驱动;微动腐蚀;扫描电镜;

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