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Improving the FE simulation of molded packages using warpage measurements

机译:使用翘曲测量改善成型包装的有限元仿真

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摘要

Due to the constant development of new components in microsystem technology the possibility to guarantee the reliability and lifetime of these components is essential. An efficient method for this purpose is Finite Element (FE) modelling. In order to shorten lengthy and expensive lifetime tests, FE simulations become more and more necessary. To obtain suitable FE models, multitude of material and technical component characteristics are needed. However, due to the rapid development of new materials, the characteristics are often insufficient or even unknown. Therefore additional measurements of the material or the complete system are necessary. Which material data is required depends first and foremost on the component and its usage. In this paper the importance of temperature dependent topographic measurements for the simulation model of a package design (Smart Power Module) will be demonstrated. The warpage of a whole package was measured at different temperatures in order to obtain unknown material behaviour like the chemical shrinkage and polymer relaxation. For this purpose, the Shadow Moire Measurement Method was utilised. This work will focus on how to obtain experimental data of two different molding compounds (MC) in several stages of lifetime as well as implementing the results in a FE simulation model.
机译:由于微系统技术中新组件的不断开发,保证这些组件的可靠性和使用寿命的可能性至关重要。为此目的的一种有效方法是有限元(FE)建模。为了缩短冗长而昂贵的寿命测试,有限元模拟变得越来越必要。为了获得合适的有限元模型,需要大量的材料和技术组件特性。但是,由于新材料的飞速发展,其特性常常不足甚至未知。因此,必须对材料或整个系统进行附加测量。首先需要哪个材料数据取决于组件及其用途。在本文中,将说明温度依赖性地形测量对于封装设计(智能电源模块)的仿真模型的重要性。为了获得未知的材料行为(例如化学收缩率和聚合物松弛),需要在不同温度下测量整个包装的翘曲。为了这个目的,使用了阴影云纹测量方法。这项工作将着重于如何在寿命的几个阶段中获得两种不同模塑料(MC)的实验数据,以及如何在有限元仿真模型中实现结果。

著录项

  • 来源
    《Microelectronics & Reliability》 |2014年第10期|1862-1866|共5页
  • 作者单位

    Fraunhofer Institute for Reliability and Microintegration [IZM], Gustav-Meyer-Allee 25, 13355 Berlin, Germany;

    Fraunhofer Institute for Reliability and Microintegration [IZM], Gustav-Meyer-Allee 25, 13355 Berlin, Germany;

    Fraunhofer Institute for Reliability and Microintegration [IZM], Gustav-Meyer-Allee 25, 13355 Berlin, Germany;

    Fraunhofer Institute for Reliability and Microintegration [IZM], Gustav-Meyer-Allee 25, 13355 Berlin, Germany;

    Technical University Berlin, Microperipheric Center, Germany;

    Technical University Berlin, Microperipheric Center, Germany;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    Reliability; Warpage; Finite element methods; Thermoire; Mold compound; Aging;

    机译:可靠性;翘曲;有限元方法;温度计模塑料老化;

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