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Junction temperature management of IGBT module in power electronic converters

机译:电力电子转换器中IGBT模块的结温管理

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摘要

IGBT power module is the key component of the power electronic converter, but it has the lowest reliability. The junction temperature is the crucial factor which affects power module's reliability. To some extent, the power handling capability of the converter depends on the thermal stress of the power module. Thermal management is an effective method to improve the reliability of power device, as well as enhance the power capability. For this purpose, this paper introduces the reliability design to the power converter's traditional compensation controller design for the first time. A new concept of generalized dual-loop controller, which includes temperature control loop and electric power control loop, is proposed. The reliability and stability of the system are both considered, with the help of the hybrid controller, the power converter can operate steadily with higher reliability. The novelty of this paper is to improve the thermal control method of carrier frequency adjustment through experimental implementation during the full life cycle of the converter. The target is to control the temperature variation to be almost a constant value as well as extend the lifetime of the converter. IR sensor is used to measure the chip temperature of the unpackaged IGBT module. The temperature variation and the average temperature are all considered in thermal management, from the reliability improvement point of view. At last, the idea is digital implemented based on a varying load of power inverter system with real-time measurement of the chip's surface temperature.
机译:IGBT电源模块是电力电子转换器的关键组件,但可靠性最低。结温是影响功率模块可靠性的关键因素。在某种程度上,转换器的功率处理能力取决于功率模块的热应力。热管理是提高功率器件可靠性并增强功率容量的有效方法。为此,本文首次将可靠性设计引入了功率转换器的传统补偿控制器设计中。提出了一种新的广义双环控制器概念,包括温度控制环和电力控制环。同时考虑了系统的可靠性和稳定性,借助混合控制器,功率转换器可以以更高的可靠性稳定运行。本文的新颖之处在于通过实验实现在转换器整个生命周期内改进载频调整的热控制方法。目标是将温度变化控制为几乎恒定值,并延长转换器的使用寿命。红外传感器用于测量未包装的IGBT模块的芯片温度。从可靠性提高的角度来看,温度变化和平均温度都在热管理中考虑。最后,该想法是基于电源逆变器系统变化的负载进行数字化实现的,并实时测量芯片的表面温度。

著录项

  • 来源
    《Microelectronics & Reliability》 |2014年第12期|2788-2795|共8页
  • 作者单位

    State Key Laboratory of Power Transmission Equipment & System Security and New Technology, College of Electrical Engineering, Chongqing University, Chongqing 400044, China;

    State Key Laboratory of Power Transmission Equipment & System Security and New Technology, College of Electrical Engineering, Chongqing University, Chongqing 400044, China,Room 6217-1, College of Electrical Engineering, Campus A, Chongqing University, No. 174, Shazheng Road, Shapingba District, Chongqing 400044, China;

    State Key Laboratory of Power Transmission Equipment & System Security and New Technology, College of Electrical Engineering, Chongqing University, Chongqing 400044, China;

    State Key Laboratory of Power Transmission Equipment & System Security and New Technology, College of Electrical Engineering, Chongqing University, Chongqing 400044, China;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    Power electronic converter; IGBT power module; Reliability; Junction temperature management;

    机译:电力电子转换器IGBT功率模块;可靠性;结温管理;

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