Gate leakage current suppression and reliability improvement for ultra-low EOT Ge MOS devices by suitable HfAlO/HfON thickness and sintering temperature

摘要

Ultra-low effective oxide thickness (EOT) Ge MOS devices with different HfAlO/HfON stacks and sintering temperatures are investigated in this work. The suppression of gate leakage current and improvement of reliability properties can be achieved by either stacked gate dielectrics or a low sintering temperature. Especially, the qualities of the interface and high-k gate dielectric in Ge devices are significantly improved through a low sintering temperature. A 0.5 nm HfAlO/2.5 nm HfON gate stack and a sintering temperature at 350 degrees C are the suitable conditions to achieve low EOT, gate leakage, and good reliability for Ge MOS devices. (C) 2015 Elsevier Ltd. All rights reserved.