Permanent and single event transient faults reliability evaluation EDA tool

摘要

In nanotechnology domain, reliability is a fundamental concern in the design and manufacturing process of VLSI circuits. Thus, this paper presents a tool developed to evaluate the reliability of logic cells in order to provide a set of information to improve design robustness. The tool is able to evaluate logic cells under Single Event Transient (SET) faults and, also, permanent faults such as Stuck-On (SOnF) and Stuck-Open (SOF). The information produced by this tool help designers to choose the most reliable cells to be adopted in their designs. (C) 2016 Elsevier Ltd. All rights reserved.