Evolution study of the ElectroMagnetic Interference for RF LDMOS in series chopper application after thermal accelerated tests

摘要

The temperature is a critical parameter, for proper functioning of a system or a circuit, particularly in RF electronic devices. It considerable influence on reliability and performances; consequently plays an essential part in failure mechanisms and in lifetime. Recent studies have been focused in ElectroMagnetic Interferences (EMI) evolution after accelerated ageing tests and their effects on robustness behaviours (static, dynamic and RF). Even rarer to use RF devices in a power application.