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Reliability enhancement of zinc oxide varistors using sputtered silver electrodes

机译:使用溅射银电极提高氧化锌压敏电阻的可靠性

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摘要

Zinc oxide (ZnO) varistors, which are produced by sintering ZnO powder together with small additives of Bi2O3, Co3O4, Sb2O3 and other oxides, are popular ceramic semiconductor devices and widely used in electric circuits and systems as voltage-clamping or surge-arrester owing to their extremely nonlinear current voltage characteristics. The reliability of ZnO varistors is the most important consideration, and researches are mainly focus on the material properties of ZnO body and the effects of additives, such as ZnO grain size and the surrounding additive-rich insulating barriers. However, the manufacturing of electrodes still remains the traditional silver baking process, and few people investigate the effects of electrodes on the reliability of devices. In this paper, we propose a novel electrodes manufacture process using magnetron sputtering technology, and investigate the reliability of devices comparing to silver baking process. Two groups of samples with diameters of 20 mm were prepared by silver baking and magnetron sputtering process respectively. The nonlinear voltage, nonlinear coefficient, and leakage current parameters were measured by the metal oxide varistor meter typed TTK-168; the energy absorption capacities were measured by a lightning current surge generator with 8/20 mu s impulse waves; the adhesive strength of electrodes was measured by a dynamometer; the microstructures of the samples were examined using Scanning Electron Microscope, and the change ratio of nonlinear voltages at an environment of 125 degrees C after 100 h was chosen as the main reliability parameter. Results show that the sputtered electrodes could improve the reliability of samples by reducing the change ratio from 1.32% to 0.61%, with other parameters exceeding the silver baking samples at the same time. This enhancement is benefit from the good interface between sputtered electrodes and ZnO substrate as well as the low temperature during magnetron sputtering process. (C) 2016 Elsevier Ltd. All rights reserved.
机译:氧化锌(ZnO)压敏电阻是通过将ZnO粉末与Bi2O3,Co3O4,Sb2O3和其他氧化物的少量添加剂烧结而制成的,是流行的陶瓷半导体器件,并广泛用作电路和系统中的电压钳位或浪涌保护使其具有非常非线性的电流电压特性。 ZnO压敏电阻的可靠性是最重要的考虑因素,研究主要集中在ZnO体的材料性能和添加剂的影响上,例如ZnO的晶粒尺寸和周围的富含添加剂的绝缘层。但是,电极的制造仍然是传统的银烘烤工艺,很少有人研究电极对设备可靠性的影响。在本文中,我们提出了一种使用磁控溅射技术的新型电极制造工艺,并与银烘烤工艺相比,研究了器件的可靠性。通过银烘烤和磁控溅射工艺分别制备了两组直径为20mm的样品。用型号为TTK-168的金属氧化物压敏电阻仪测量非线性电压,非线性系数和漏电流参数。能量吸收能力是由雷电流冲击发生器以8 /20μs的脉冲波测量的。电极的粘合强度通过测力计测量。采用扫描电子显微镜对样品的微观结构进行了研究,并选择了100 h后125摄氏度环境下的非线性电压变化比作为主要可靠性参数。结果表明,溅射电极可以通过将变化率从1.32%降低到0.61%来提高样品的可靠性,同时其他参数同时超过了银烘烤样品。这种增强得益于溅射电极与ZnO衬底之间的良好界面以及磁控溅射过程中的低温。 (C)2016 Elsevier Ltd.保留所有权利。

著录项

  • 来源
    《Microelectronics & Reliability》 |2016年第6期|91-94|共4页
  • 作者单位

    Zhejiang Univ, Coll Informat Sci & Elect Engn, Hangzhou 310027, Zhejiang, Peoples R China;

    Kunshan Wanfeng Elect Co Ltd, Kunshan 215313, Peoples R China;

    Zhejiang Univ, Coll Informat Sci & Elect Engn, Hangzhou 310027, Zhejiang, Peoples R China;

    Zhejiang Univ, Coll Informat Sci & Elect Engn, Hangzhou 310027, Zhejiang, Peoples R China|Zhejiang Univ, Kunshan Innovat Inst, Kupshan 215300, Peoples R China|Suzhou Adv Vacuum Elect Equipment Co Ltd, Kunshan 215300, Peoples R China;

    Zhejiang Univ, Coll Informat Sci & Elect Engn, Hangzhou 310027, Zhejiang, Peoples R China|Zhejiang Univ, Kunshan Innovat Inst, Kupshan 215300, Peoples R China|Suzhou Adv Vacuum Elect Equipment Co Ltd, Kunshan 215300, Peoples R China;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    Zinc oxide; Varistor; Electrodes manufacture; Magnetron sputtering; Reliability;

    机译:氧化锌;压敏电阻;电极制造;磁控溅射;可靠性;
  • 入库时间 2022-08-18 01:25:41

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