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An embedded trace FCCSP substrate without glass cloth

机译:无需玻璃布的嵌入式痕量FCCSP基板

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摘要

Coreless embedded trace has attracted interest from mobile device, in few metal layer Flip-Chip Chip Scale Package (FCCSP) substrate design, for electrical performance, high density, and thickness reduction. However, the mainstream Prepreg (PP) dielectrics with glass-cloth utilized in coreless embedded trace substrate (ETS) are insufficient to fulfill future requirements of warpage behavior, RF performance, miniaturization and even cost. This research is targeted on developing an alternative 2-layer coreless ETS technology platform, without glass-cloth, to make up the above shOrtage. The total solution from substrate fabrication to package verification had been studied. With the design for manufacturability and reliability approaches, a pioneering 120 mu m thin 2-layer coreless ETS, by Ajinomoto Buildup Film-like dielectric without glass-fabric, was developed for FCCSP, with both experimental and simulation efforts. Compared with the conventional PP with glass-cloth, a cost effective substrate featured with 20% thinner and 20% less package warpage deformation was gained. The new material scheme also allows better compatibility with fine pitch design and RF transmission. This technology can be an extended process platform to higher multi-layer (>= 3) advanced coreless substrate for flip chip BGA & module assemblies. (C) 2015 Elsevier Ltd. All rights reserved.
机译:无芯嵌入式痕迹已经吸引了移动设备的兴​​趣,因为它具有很少的金属层倒装芯片尺寸封装(FCCSP)基板设计,以实现电气性能,高密度和厚度减小。然而,无芯嵌入式痕量基板(ETS)中使用的带有玻璃布的主流预浸料(PP)电介质不足以满足未来对翘曲行为,RF性能,小型化甚至成本的要求。这项研究的目标是开发一种无需玻璃布的替代性2层无芯ETS技术平台,以构成上述shOrtage。研究了从基板制造到封装验证的整体解决方案。通过可制造性和可靠性方法的设计,通过实验和仿真工作,为FCCSP开发了具有开创性的120微米薄的2层无芯ETS,该产品由Ajinomoto Buildup膜状电介质制成,不含玻璃纤维。与具有玻璃布的传统PP相比,具有成本效益的基材具有更薄的20%和更少的包装翘曲变形20%的特点。新的材料方案还允许与小间距设计和RF传输更好地兼容。这项技术可以成为用于倒装芯片BGA和模块组件的高级多层(> = 3)高级无芯基板的扩展处理平台。 (C)2015 Elsevier Ltd.保留所有权利。

著录项

  • 来源
    《Microelectronics & Reliability》 |2016年第2期|101-110|共10页
  • 作者单位

    Adv Semicond Engn Inc, NEPZ Zone, 26 Chin,3rd Rd, Kaohsiung, Taiwan|Natl Cheng Kung Univ, Dept Ind Design, 1 Tahseuh Rd, Tainan 701, Taiwan;

    Adv Semicond Engn Inc, NEPZ Zone, 26 Chin,3rd Rd, Kaohsiung, Taiwan;

    Adv Semicond Engn Inc, NEPZ Zone, 26 Chin,3rd Rd, Kaohsiung, Taiwan;

    Adv Semicond Engn Inc, NEPZ Zone, 26 Chin,3rd Rd, Kaohsiung, Taiwan;

    Adv Semicond Engn Inc, NEPZ Zone, 26 Chin,3rd Rd, Kaohsiung, Taiwan;

    Adv Semicond Engn Inc, NEPZ Zone, 26 Chin,3rd Rd, Kaohsiung, Taiwan;

    Natl Cheng Kung Univ, Dept Ind Design, 1 Tahseuh Rd, Tainan 701, Taiwan;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    FCCSP warpage; Coreless substrate; Embedded trace; Design for manufacturability;

    机译:FCCSP翘曲;无芯基板;嵌入式走线;可制造性设计;

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