Proceedings of the 28th European Symposium on the reliability of electron devices, failure physics and analysis

Labat Nathalie; Marc Francois; Fremont Helene; Bafleur Marise

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Proceedings of the 28th European Symposium on the reliability of electron devices, failure physics and analysis

机译：第28届欧洲电子设备可靠性，故障物理和分析研讨会论文集

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来源
《Microelectronics & Reliability》 |2017年第9期|1-4|共4页
作者
Labat Nathalie; Marc Francois; Fremont Helene; Bafleur Marise;
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收录信息美国《科学引文索引》(SCI);美国《工程索引》(EI);
原文格式 PDF
正文语种 eng
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1. SPECIAL ISSUE: PROCEEDINGS OF THE 26TH EUROPEAN SYMPOSIUM ON RELIABILITY OF ELECTRON DEVICES, FAILURE PHYSICS AND ANALYSIS [J] . Bafleur Marise, Perdu Philippe, Marc Francois, Microelectronics & Reliability . 2015,第9a10期

机译：专题：第26届欧洲电子设备可靠性，故障物理和分析研讨会的议事录
2. Editorial of 31st European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2020) [J] . Papaioannou George Microelectronics & Reliability . 2020,第Nova期

机译：31世纪欧洲电子设备可靠性研讨会（ESREF 2020）编辑
3. Statistics-related and reliability-physics-related failure processes in electronics devices and products [J] . E. Suhir Modern Physics Letters, B. Condensed Matter Physics, Statistical Physics, Applied Physics . 2014,第13期

机译：电子设备和产品中与统计相关和与可靠性物理相关的故障过程
4. Proceedings of the 7th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis [C] . Reliability of Electron Devices, Failure Physics and Analysis, 1996. Proceedings of the 7th European Symposium on . 1996

机译：第七届欧洲电子设备可靠性，故障物理与分析研讨会论文集
5. Microgrid Reliability Evaluation Based on Condition-Dependent Failure Models of Power Electronic Devices [D] . Li, Qi. 2018

机译：基于条件相关失效模型的电力电子设备微电网可靠性评估
6. Proceedings of the IX International Symposium on Phlebotomine Sandflies (ISOPS IX) Reims France June 28th–July 1st 2016 [O] . Jérôme Depaquit, Bernard Pesson, Denis Augot, 2016

机译：2016年6月28日至7月1日法国兰斯举行的第九届国际博乐le沙蝇国际研讨会论文集（ISOPS IX）
7. Proceedings of the 28th ACM Joint Meeting on European Software Engineering Conference and Symposium on the Foundations of Software Engineering [O] . 2020

机译：欧洲软件工程会议与软件工程基础欧洲软件工程会议和研讨会的第28届ACM联席会议
8. ESREF 98 - 9th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis [R] . 1998

机译：EsREF 98 - 第9届欧洲电子器件可靠性，失效物理和分析研讨会

Proceedings of the 28th European Symposium on the reliability of electron devices, failure physics and analysis

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