...
首页> 外文期刊>Microelectronics & Reliability >Highly reliable and low-power magnetic full-adder designs for nanoscale technologies
【24h】

Highly reliable and low-power magnetic full-adder designs for nanoscale technologies

机译:纳米技术的高度可靠,低功耗的磁性全加器设计

获取原文
获取原文并翻译 | 示例
   

获取外文期刊封面封底 >>

       

摘要

The MTJ-based circuits have been considered as a candidate for next generation digital integrated circuits thanks to their attractive features such as nonvolatility, low leakage current, high endurance, and CMOS integration compatibility. However, incurred energy and delay by reconfiguration of their employed conventional MTJs limit their application. Besides, the issue of read-disturbance is another challenge in such MTJ-based circuit designs. In this article, a new magnetic-based full-adder (MFA) circuit based on a new three-terminal two-in-one magnetic tunnel junction (TIO-MTJ) cell is proposed. Comparing with the previous MFA circuits, the proposed circuit offers a lower energy for the write operation and also a disturbance-free reading. Two improved structures based on the proposed MFA are also suggested to obtain the advantages of nonvolatility for the power-gating architectures and also radiation hardening for the radiation harsh environments. (C) 2017 Elsevier Ltd. All rights reserved.
机译:由于基于MTJ的电路具有非易失性,低漏电流,高耐久性和CMOS集成兼容性等吸引人的特性,它们被认为是下一代数字集成电路的候选者。然而,通过重新配置所使用的常规MTJ而引起的能量和延迟限制了它们的应用。此外,在这种基于MTJ的电路设计中,读取干扰的问题是另一个挑战。本文提出了一种基于新型三端二合一磁性隧道结(TIO-MTJ)单元的新型基于磁性的全加法器(MFA)电路。与以前的MFA电路相比,该电路为写操作提供了较低的能量,并且无干扰地进行了读取。还建议了基于所提出的MFA的两种改进结构,以实现电源门控体系结构具有非易失性的优势,并能在辐射恶劣的环境中实现辐射硬化。 (C)2017 Elsevier Ltd.保留所有权利。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号