首页> 外文期刊>Microelectronics & Reliability >Interfacial reactions and mechanical strength of Sn-3.0Ag-0.5Cu/Ni/Cu and Au-20Sn/Ni/Cu solder joints for power electronics applications
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Interfacial reactions and mechanical strength of Sn-3.0Ag-0.5Cu/Ni/Cu and Au-20Sn/Ni/Cu solder joints for power electronics applications

机译:用于电力电子应用的Sn-3.0Ag-0.5Cu / Ni / Cu和Au-20Sn / Ni / Cu焊点的界面反应和机械强度

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摘要

The mechanical strength of Sn-3.0Ag-0.5Cu (SAC305) and Au-20Sn solder joints and their interfacial reaction with a Ni-plated ceramic substrate were evaluated to assess their suitability for use as die attach materials in power module applications. The compatibility between the two solder alloys and the Ni substrate was assessed during isothermal long-term aging, while the mechanical strength of the two solder joints was measured by die shear testing. A higher intermetallic compound (IMC) growth rate and Ni consumption rate was observed in the SAC305 solder joint, with the formation of a thick IMC layer and weak interface resulting in brittle fracture. The Au-20Sn solder joint, on the other hand was found to exhibit superior high temperature interfacial stability and joint strength. (C) 2017 Elsevier Ltd. All rights reserved.
机译:对Sn-3.0Ag-0.5Cu(SAC305)和Au-20Sn焊点的机械强度以及它们与镀镍陶瓷基板的界面反应进行了评估,以评估它们在功率模块应用中用作芯片连接材料的适用性。在等温长期老化过程中评估了两种焊料合金与Ni基体之间的相容性,同时通过模切测试测量了两种焊料接头的机械强度。在SAC305焊点中观察到较高的金属间化合物(IMC)生长速率和Ni消耗速率,形成较厚的IMC层和较弱的界面会导致脆性断裂。另一方面,发现Au-20Sn焊点具有优异的高温界面稳定性和接点强度。 (C)2017 Elsevier Ltd.保留所有权利。

著录项

  • 来源
    《Microelectronics & Reliability》 |2017年第4期|119-125|共7页
  • 作者单位

    Korea Inst Ind Technol KITECH, Welding & Joining R&D Grp, 156 Gaetbeol Ro, Incheon 21999, South Korea;

    Korea Inst Ind Technol KITECH, Welding & Joining R&D Grp, 156 Gaetbeol Ro, Incheon 21999, South Korea;

    Korea Inst Ind Technol KITECH, Welding & Joining R&D Grp, 156 Gaetbeol Ro, Incheon 21999, South Korea;

    Korea Inst Ind Technol KITECH, Welding & Joining R&D Grp, 156 Gaetbeol Ro, Incheon 21999, South Korea|UST, Crit Mat & Semicond Packaging Engn, 217 Gajeong Ro, Daejeon 34113, South Korea;

    Korea Inst Ind Technol KITECH, Welding & Joining R&D Grp, 156 Gaetbeol Ro, Incheon 21999, South Korea|UST, Crit Mat & Semicond Packaging Engn, 217 Gajeong Ro, Daejeon 34113, South Korea;

    Korea Inst Ind Technol KITECH, Welding & Joining R&D Grp, 156 Gaetbeol Ro, Incheon 21999, South Korea|UST, Crit Mat & Semicond Packaging Engn, 217 Gajeong Ro, Daejeon 34113, South Korea;

    Korea Inst Ind Technol KITECH, Welding & Joining R&D Grp, 156 Gaetbeol Ro, Incheon 21999, South Korea|UST, Crit Mat & Semicond Packaging Engn, 217 Gajeong Ro, Daejeon 34113, South Korea;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    Sn-3.0Ag-0.5Cu solder; Au-20Sn solder; Power packaging; Interfacial reactions; Intermetallic compound (IMC);

    机译:Sn-3.0Ag-0.5Cu焊料;Au-20Sn焊料;电源包装;界面反应;金属间化合物(IMC);

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