Device reliability and robust power converter development

摘要

This paper describes a top-down approach investigation of power electronic systems used in terrestrial and space applciations. Results obtained from several case studies are presented that describe in detail both short-term and field failures of high-power DC-DC and AC-DC converters and the causes there-in. A systematic approach is presented that can be used to correlate field failures of power converters to residual defects and contaminants left in the semiconductor power witch, packaging and thermal management. Thechniues and strategies that need to be applied in developing robust power converters for the next millennium are also outlined.