The test of present integrated circuits exhibits many confining aspects, among them the adequate selection of the observable variables, the use of combined testing approaches, an each time more restricted controllabity and obseravaility (physically and electrically) and finally the required testing time. In the paper these points are discussed and different nowadays-promising techniques exposed. complementarily to th elogic output variable analysis (both value and delay) three efficient detection and localisation theciques can be considered that are contemplated in this work: the detection of light, heat and leadage currents due to the presence of failures. In most of the cases it is not possible ot differentiate clearly, like was in the past, the production testing, hte in-field testing, the test and the localisation of the failure, making each time closer the fields of testing and failure analysis.
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