Extended SPICE-like model accounting for layout effects on snapback phenomenon during ESD events.

P.Salome; C.Richier; S.Essaifi

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Extended SPICE-like model accounting for layout effects on snapback phenomenon during ESD events.

机译：类似于SPICE的扩展模型，说明了ESD事件期间布局对回跳现象的影响。

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An extended SPICE-like model for snapback phenomenon including the impact of gate length and substrate on the holding voltage is presented. Substrate conduction is analytically solved thanks to a transmission line model. A fast extraction methodology is also described. This model is in good agreement with the measurements performed on deeply submicron CMOS technologies.

机译：提出了一种扩展的类似于SPICE的回跳现象模型，其中包括栅极长度和衬底对保持电压的影响。借助传输线模型可以解析地解决衬底导电问题。还描述了一种快速提取方法。该模型与在深亚微米CMOS技术上进行的测量非常吻合。

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《Microelectronics & Reliability》 |1999年第7期|833-838|共6页
作者
P.Salome; C.Richier; S.Essaifi;
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收录信息美国《科学引文索引》(SCI);美国《工程索引》(EI);
原文格式 PDF
正文语种 eng
中图分类一般性问题;
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入库时间 2022-08-18 00:41:23

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1. Modeling MOS snapback and parasitic bipolar action forcircuit-level ESD and high-current simulations [J] . Amerasekera A., Mi-Chang Chang, Duvvury C., IEEE Circuits & Devices . 1997,第2期

机译：为电路级ESD和大电流仿真建模MOS骤回和寄生双极性作用
2. Modeling MOS snapback and parasitic bipolar action for circuit-level ESD and high-current simulations [J] . Amerasekera A., Mi-Chang Chang IEEE Circuits & Devices . 1997,第2期

机译：为电路级ESD和大电流仿真建模MOS骤回和寄生双极性作用
3. Reverse conducting–IGBTs initial snapback phenomenon and its analytical modelling [J] . Vemulapati U., Kaminski N., Silber D., Circuits, Devices & Systems, IET . 2014,第3期

机译：反向导通-IGBT的初始回跳现象及其解析模型
4. Extended SPICE-like model accounting for layout effects on snapback phenomenon during ESD events [C] . P. Salome, C. Richier, S. Essaifi, 10th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis 5-8 October 1999 Bordeaux, France . 1999

机译：类似于SPICE的扩展模型，解决了ESD事件期间布局对回跳现象的影响
5. Modeling and simulation of full-component integrated circuits in transient ESD events. [D] . Meng, Kuo-Hsuan. 2015

机译：瞬态ESD事件中全组件集成电路的建模和仿真。
6. Extending Integrate-and-Fire Model Neurons to Account for the Effects of Weak Electric Fields and Input Filtering Mediated by the Dendrite [O] . Florian Aspart, Josef Ladenbauer, Klaus Obermayer 2016

机译：扩展积分并发射模型神经元以解决弱电场的影响以及由枝晶介导的输入滤波
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Extended SPICE-like model accounting for layout effects on snapback phenomenon during ESD events.

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