Reliability of compound semiconductor devices for space applications

摘要

Application of semiconductor devices in high reliabiltiy space systems requires a thorough understanding of the reliability and failure mechanisms associated with the selected devices. This paper provides a dwcription of the reliabiltiy and qualification issues related to the application of compound semiconductor devices in critical space systems. A discussion of common failure mechanisms, radiation effects and other reliablity concerns is provided along with a discussion of methods for technology qualification for high reliability space applications.