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Single chip bumping and reliabiltiy for flip chip processes

机译:单芯片凸块和倒装芯片工艺的可靠性

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摘要

Processes of bump deposition based on mechanicla procedures together with their reliabiltiy data are summarized in this paper. The stud bumping of gold, palladium, and solder is described and also a novel bumping approach for fine pitch solder deposition down to 100 μm pitches using thermosonic bonding on a modified wedge-wedge bonding machine. This wedge bumping doesn't require a wire flame-off process step. Because of this, no active atmosphere is necessary. The miniumum pad diameter which can be bumped using the solder wedge bumping is 50 μm, up to now. This bumping process is highly reprduible and therefore well-suited for different flip chip soldering appications. palladium stud bumps provide a solderable under bump metallization. Resuts from aging of lead/tin solder bumps on palladium are shown. The growth of intermetallics and its impact on the mechanical reliabilty are investigated.
机译:本文总结了基于力学程序的凸点沉积工艺及其可靠性数据。描述了金,钯和焊料的柱形凸点,并且还介绍了一种新颖的凸点方法,该方法可在改进的楔形楔形键合机上使用热超声键合来将最小间距为100μm的细间距焊料沉积。这种楔形凸块不需要导线熄火工艺步骤。因此,不需要活跃的气氛。到目前为止,可以使用楔形焊料凸块进行凸焊的最小焊盘直径为50μm。这种隆起工艺具有很高的重复性,因此非常适合于不同的倒装芯片焊接应用。钯柱头凸点可在凸点金属化条件下提供可焊性。显示了由于钯/铅/锡焊料凸块的老化而导致的结果。研究了金属间化合物的生长及其对机械可靠性的影响。

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