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首页> 外文期刊>Microelectronics reliability >Effects of bismuth additions on mechanical property and microstructure of SAC-Bi solder joint under current stressing
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Effects of bismuth additions on mechanical property and microstructure of SAC-Bi solder joint under current stressing

机译:铋添加对电流应力下囊型焊点力学性能和微观结构的影响

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摘要

Bi additions have been reported to improve the wettability and drop-impact performance. Most important of all, it improves the mechanical properties. However, few studies focus on the effect of the Bi addition on mechanical properties and microstructure of intermetallic compounds (IMCs) in solder balls, especially on those properties after current stressing. In this study, to understand the effect of Bi addition, a lead-free Sn-3Ag-0.5Cu-xBi (SAC305-Bi) solder joint with Bi additions from 1 to 3 wt% was used to investigate mechanical property of Sn-rich matrix and microstructure of IMCs in the solder joint after current stressing process. We combined nanoindentation, scanning electron microscope (SEM), energy-dispersive X-ray spectroscopy (EDS) and electron backscatter diffraction (EBSD) to analyze mechanical property, and observe the intermetallic compounds of Cu3Sn, and Cu6Sn5 at the interface. The mechanical properties of hardness in Sn matrix is improved by the amount of Bi, where the hardness increases from 0.095 to 0.141 Gpa as increasing Bi addition from 1 to 3 wt%. In addition, the growth rate constant of intermetallic compounds of Cu3Sn is in the range between 0.175 and 0.256, that is, Cu3Sn is not sensitive to Bi addition. Furthermore, the amount of doping Bi addition enhances the growth rate Cu6Sn5, as the rate constant increases from 1.597 to 2.413 with increasing Bi addition from 1 to 3 wt%.
机译:据报道,BI添加以改善润湿性和抗冲击性能。最重要的是,它改善了机械性能。然而,很少有研究重点关注BI添加对焊球中金属间化合物(IMC)的机械性能和微观结构的影响,特别是在电流胁迫后的那些性质上。在这项研究中,为了了解BI的作用,使用1至3wt%的无铅Sn-3Ag-0.5Cu-XBi(SAC305-Bi)焊点,用于研究SN的机械性能电流应力过程后焊接接头中IMC的基质和微观结构。我们组合纳米凸缘,扫描电子显微镜(SEM),能量分散X射线光谱(EDS)和电子反向散射衍射(EBSD)以分析力学性质,并观察Cu3Sn的金属间化合物和界面的Cu6Sn5。 Sn基质中硬度的机械性能通过BI的量改善,其中硬度从0.095到0.141GPa增加,因为增加了1至3wt%的Bi加入。另外,Cu3Sn金属间化合物的生长速率常数在0.175和0.256之间,即Cu3Sn对Bi添加不敏感。此外,掺杂BI加入的量增强了生长速率Cu6SN5,因为速率恒定从1.597增加到2.413,从1至3wt%增加。

著录项

  • 来源
    《Microelectronics reliability》 |2021年第2期|114041.1-114041.11|共11页
  • 作者单位

    Department of Materials Science and Engineering National Cheng-Kung University Tainan 701 Taiwan;

    Advanced Semiconductor Engineering Inc. 26 Chin 3rd Rd. Nantze Export Processing Zone Kaohsiung 811 Taiwan;

    Advanced Semiconductor Engineering Inc. 26 Chin 3rd Rd. Nantze Export Processing Zone Kaohsiung 811 Taiwan;

    Department of Materials Science and Engineering National Cheng-Kung University Tainan 701 Taiwan;

    Department of Materials Science and Engineering National Cheng-Kung University Tainan 701 Taiwan;

    Department of Materials Science and Engineering National Cheng-Kung University Tainan 701 Taiwan;

    Department of Materials Science and Engineering National Cheng-Kung University Tainan 701 Taiwan;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    Bi additions; Electromigration; Mechanical properties; Microstructure; SAC305 lead-free solder;

    机译:BI添加;电迁移;机械性能;微观结构;SAC305无铅焊料;

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