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机译:总电离剂量对130nm PD SOI 1 / O NMOSFET的RF性能的影响
Chinese Acad Sci Shanghai Inst Microsyst & Informat Technol State Key Lab Funct Mat Informat Shanghai 200050 Peoples R China|Univ Chinese Acad Sci Beijing 100049 Peoples R China;
Chinese Acad Sci Shanghai Inst Microsyst & Informat Technol State Key Lab Funct Mat Informat Shanghai 200050 Peoples R China|Univ Chinese Acad Sci Beijing 100049 Peoples R China;
Chinese Acad Sci Shanghai Inst Microsyst & Informat Technol State Key Lab Funct Mat Informat Shanghai 200050 Peoples R China|Univ Chinese Acad Sci Beijing 100049 Peoples R China;
Chinese Acad Sci Shanghai Inst Microsyst & Informat Technol State Key Lab Funct Mat Informat Shanghai 200050 Peoples R China;
f(T)(cut-off frequency); f(max)(maximum oscillation frequency); Output conductance (g(ds)); Partially depleted (PD) SOI; RF(radio frequency); STI(shallow trench isolation); Total ionizing dose (TID);
机译:130nm PDSOI I / O nMOSFET中总电离剂量对体电流影响的分析研究
机译:130-NM PdSOI I / O NMOSFET中总电离剂量对体电流影响的分析研究
机译:130nm PDSOI输入/输出NMOSFET中总电离剂量引起的单晶体管锁存
机译:130 nm SOI技术中耐辐射锁相环的总电离剂量灵敏度
机译:单事件瞬态和总电离剂量对低于10 nm节点CMOS的III-V MOSFET产生影响。
机译:使用氟处理的MOHOS改善总电离剂量辐射传感器的性能
机译:在130nm T型栅极PDSOI I / O NMOSFET中的总电离剂量诱导的身体屏蔽效果
机译:在Nasa计划的低剂量率总电离剂量(TID)测试下评估高性能转换器