A reliability evaluation method for multi-performance degradation products based on the Wiener process and Copula function

摘要

This paper is intended to propose a reliability evaluation method for products with high-reliability, long-life, small samples and multi-performance degradation. The Wiener process is used to model the degradation of a single performance parameter of the product to obtain its reliability evaluation model, since this can effectively describe the randomness of the product performance degradation process. Afterward, the Copula function is used to model the degradation of multiple performance parameters of the product, and a comprehensive determination method of the Copula function is proposed which can accurately and effectively describe the coupled competition relationship of multi-performance degradation. Finally, the reliability evaluation of an insulated gate bipolar transistor is carried out, and the evaluation results are compared with the evaluation results of traditional methods that only consider a single performance parameter or multiple independent performance parameters. The results show that the method proposed is more accurate and more applicable than the traditional methods.