Circuit design using Schmitt Trigger to reliability improvement

摘要

This paper presents a design strategy to reduce the impact of process variations and soft error susceptibility in FinFET circuits. The mitigation is provided by connecting a Schmitt Trigger at the logic gate output. The improvements in power and delay variability can reach up to 32.6% and 42.1%, respectively, with logic cells almost immune to soft error even at the near-threshold regime. When compared with other circuit-level methods such as sleep transistor, decoupling cells, and transistor reordering, on average, the Schmitt Trigger technique is at least 6%, 8%, and 10.5% more robust to process variability, respectively.