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FlexGripPlus: An improved GPGPU model to support reliability analysis

机译:FlexGripplus:一种改进的GPGPU模型,支持可靠性分析

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摘要

General Purpose Graphics Processing Units (GPGPUs) have been extensively used in the last decade as accelerators in high demanding applications, such as multimedia processing and high-performance computing. Nowadays, these devices are becoming popular even in safety-critical applications, such as in autonomous and semi-autonomous vehicles. However, these devices can suffer from the effects of transient faults, such as those produced by radiation effects. Among those effects, Single Event Upsets (SEUs), which are the focus of this paper, can cause application misbehaviors, which may lead to catastrophic consequences. In this work, we first describe how we extended the capabilities of an open-source VHDL GPGPU model (FlexGrip) and developed a new version named FlexGripPlus to study and analyze the effects of SEUs in a GPGPU in a much more detailed manner. We also performed extensive fault injection campaigns using FlexGripPlus, which allowed identifying the most critical effects within the GPGPU architecture. We finally focused on the scheduler controller since it represents a module that is specific to the GPGPU architecture and showed that it has different levels of SEU sensibility depending on the affected location. Moreover, the results of additional analyses varying the number of parallel execution units in the system are presented, demonstrating the correlation between the number of execution units in a GPGPU and the system reliability.
机译:通用图形处理单元(GPGPU)在过去十年中被广泛使用,因为高苛刻应用中的加速器,例如多媒体处理和高性能计算。如今,即使在安全关键的应用程序中,这些设备也变得流行,例如在自主和半自动车辆中。然而,这些设备可能遭受瞬态断层的影响,例如通过辐射效应产生的效果。在这些效果中,单一事件UPSET(SEU)是本文的重点,可能导致申请不端行为,这可能导致灾难性后果。在这项工作中,我们首先描述了我们如何扩展开源VHDL GPGPU模型的功能(FlexGrip),并开发了一个名为FlexGripplus的新版本,以更详细的方式研究和分析GPGPU中SEA的影响。我们还使用FlexGripPlus进行了广泛的故障注入活动,允许识别GPGPU架构中最关键的影响。我们最终专注于调度程序控制器,因为它代表了一个特定于GPGPU架构的模块,并且显示它具有不同级别的SEU感性,这取决于受影响的位置。此外,提出了改变系统中的并行执行单元的数量的附加分析结果,展示了GPGPU中的执行单元数量与系统可靠性之间的相关性。

著录项

  • 来源
    《Microelectronics & Reliability》 |2020年第6期|113660.1-113660.14|共14页
  • 作者单位

    Politecn Torino Dipartimento Automat & Informat Turin Italy;

    Politecn Torino Dipartimento Automat & Informat Turin Italy;

    Politecn Torino Dipartimento Automat & Informat Turin Italy;

    Politecn Torino Dipartimento Automat & Informat Turin Italy;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

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