TR-DLS analysis on analog circuit

摘要

Analog circuits are often challenging to debug with dynamic laser stimulation (DLS) due to intrinsic sensitivity of some circuitries to carrier generations. This paper showcases successful post-silicon debug on analog circuitries (start-up circuit) using nanosecond pulse-on-demand laser to perform Time-resolved Dynamic Laser Stimulation (TR-DLS), leading into root cause identification on a marginality issue in a sub-20 nm FinFET technology device.