Failure analysis case studies of floating nets in mixed-signal IC

摘要

Two case studies concerning failure analysis on open via defects are presented in this paper. Both of them were performed on a mixed-signal product for automotive application and showed several analysis techniques used to find defective net. First example showed the use of well-known Emission Microscopy (EMMI) in combination with advanced electrical setup to highlight floating net. This case study showed the need to thoroughly interpret EMMI signatures in combination with extensive setup investigation in order to solve an analysis with a complex failure mode. Second example showed an innovative use of Dynamic Thermal Laser Stimulation to identify a floating gate.