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Life prediction of copper wire bonds in commercial devices using principal component analysis (PCA)

机译:使用主成分分析(PCA)预测商用设备中铜线键合的寿命

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Copper has been widely adopted as a viable alternative to gold for wire bonding, due to its lower cost, better electrical and thermal conductivity, lower tendency for wire sweep due to a higher modulus and slower intermetallic compound (IMC) formation with aluminum bond-pad. However, these IMCs can cause an increase in resistance and separation between bonding interface which causes an open circuit. Wire bond and component reliability must consider all factors in combination with the change of wire bond materials and processes. How can users of off-the-shelf components determine the effects of wire bond material changes on the reliability of the components in their systems? How will these changes affect high reliability applications such as automotive, military and harsh environments?Although physics-of-failure based models can represent the failure mechanisms individually, the complex nature of the mixed failure mechanism has inhibited development of an analytical equation to represent it. In addition, geometrical and material characteristics of the entire package along with bonding process parameters play a crucial role in magnitude of stress experienced by these bonds, portraying difficulty in developing one such equation for use to all copper wire bonded devices. This study has aimed to develop a data-based predictive method based on the principal component analysis technique to provide an estimate of the wire bond time to failure for plastic encapsulate components. Extensive thermal cycling experiments have been performed on multiple commercial devices to obtain training data for the model. This method of wire bond fatigue and failure prediction is an adaptive technique which can achieve greater accuracy as more data is added. This method aims to provide a life-time estimate of copper wire bonded component with inputs such as initial geometrical, material properties, and wire bond related attributes for a specific package.
机译:铜由于其成本低,导电性和导热性好,由于模量较高和铝键合焊盘形成金属间化合物(IMC)的速度较慢而被广泛用作金线焊的可行替代品,因此具有较低的成本,更好的导电性和导热性,较低的扫线趋势。但是,这些IMC会导致电阻增加以及键合界面之间的分离,从而导致开路。引线键合和组件的可靠性必须结合引线键合材料和工艺的变化综合考虑所有因素。现有组件的用户如何确定引线键合材料变化对系统中组件可靠性的影响?这些变化将如何影响高可靠性应用,例如汽车,军事和恶劣环境?尽管基于故障物理的模型可以单独表示故障机制,但混合故障机制的复杂性阻碍了解析方程式的发展。 。另外,整个封装的几何和材料特性以及键合工艺参数在这些键合所承受的应力大小中起着至关重要的作用,描绘了开发用于所有铜线键合器件的方程式的难度。这项研究旨在开发基于主成分分析技术的基于数据的预测方法,以估计塑料封装组件的引线键合失效时间。已经在多种商用设备上进行了广泛的热循环实验,以获得该模型的训练数据。这种引线键合疲劳和故障预测方法是一种自适应技术,随着添加更多数据,可以实现更高的精度。该方法旨在提供带有特定封装的输入(例如初始几何形状,材料特性以及与引线键合相关的属性)的铜引线键合组件的寿命估算。

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