机译:65 nm双阱和三阱CMOS技术对重离子诱导的单事件多次瞬变(SEMT)的角度依赖性
College of Computer, National University of Defense Technology|Hunan University of Humanities Science and Technology;
College of Computer, National University of Defense Technology;
College of Computer, National University of Defense Technology;
College of Computer, National University of Defense Technology;
College of Computer, National University of Defense Technology;
Charge sharing; Characterization; Single-even multiple transients (SEMTs); Angular dependency;
机译:65 nm双阱和三阱CMOS技术中虚拟门隔离逻辑节点之间的单事件瞬态脉冲猝灭特性
机译:质子辐射对65nm CMOS技术中重离子诱导的单事件瞬态的影响
机译:在升高的温度下采用65nm体CMOS技术在nMOS和pMOS晶体管中进行单事件瞬态测量
机译:65 nm批量技术中的单事件多瞬态(SEMT)测量
机译:铟镓砷化物MOSFET的单一事件瞬变,用于SUB-10 NM CMOS技术
机译:使用65 nm CMOS技术单片集成的CMOS-NEMS铜开关
机译:深N +井对65nm三重井NMOSFET的单事件瞬态的影响