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Experimental determination of the Young's modulus of copper and solder materials for electronic packaging

机译:电子封装用铜和焊料材料的杨氏模量的实验测定

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摘要

The paper presents details about the adequate experimental determination of the Young's modulus on miniaturised specimens for material used in electronic packaging. The difficulty to determine accurately the Young's modulus is caused by the requirements of representative specimens for the area of electronic packaging. In many cases, such specimens e.g. solder balls are connected with the issues of inhomogeneous stress distributions, small dimensions, or special gripping requirements, that create a number of challenges to conduct mechanical experiments. In addition, there are problems that arise from the nonlinearities in the constitutive behaviour of the material to be characterised, such as creep deformation. Therefore, any attempt to accurately determine the Young's modulus needs a case to case consideration of the specific issues for the given specimen and material.
机译:本文介绍了有关电子封装材料的小型化样品上杨氏模量的适当实验测定的详细信息。准确确定杨氏模量的困难是由于代表性样品对电子包装面积的要求而引起的。在许多情况下,例如焊球与应力分布不均匀,尺寸小或特殊的夹持要求有关,这对进行机械实验提出了许多挑战。另外,由于待表征材料的本构行为的非线性,例如蠕变变形,还存在一些问题。因此,要精确确定杨氏模量的任何尝试都需要根据给定样本和材料的具体问题进行考虑。

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  • 来源
    《Microelectronics & Reliability》 |2018年第12期|251-256|共6页
  • 作者单位

    Saarland University, Dept. Systems Engineering, Chair of Microintegration and Reliability;

    Fraunhofer Institute for Ceramic Technologies and Systems, Dept. Testing of Electronics and Optical Methods;

    Fraunhofer Institute for Ceramic Technologies and Systems, Dept. Testing of Electronics and Optical Methods;

    Saarland University, Dept. Systems Engineering, Chair of Microintegration and Reliability;

    Technical University Dresden, Faculty of Electrical and Computer Engineering, Institute of Electronic Packaging Technology;

    Saarland University, Dept. Systems Engineering, Chair of Microintegration and Reliability;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

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