A new type of scanning probe microscope: combination between an electrometer and a THz microscope

摘要

We present a new application of the quantum Hall effect (QHE): a combined technique of an electrometer and a THz microscope. In this system, we exploit the QHE devices as a voltage sensor and a THz detector. Using this technique, we simultaneously mapped out longitudinal voltage and cyclotron emission in a quantized Hall bar. This measurement enabled us to separately image spatial distributions of intra- and inter-Landau-level scattering in the QHE systems.