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PFD with improved average gain and minimal blind zone combined with lock-in detection for fast settling PLLs

机译:PFD具有改进的平均增益和最小盲区与锁定检测结合快速沉降PLL

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摘要

In this paper, two Phase frequency detector (PFD) architectures and a PFD with lock-in detection (PFD-LID) are proposed that are designed using the new techniques for selectively resetting the outputs to achieve improved average gain with a lower blind zone. The two proposed PFDs are designed and fabricated using 180 nm CMOS process. The circuits are tested with the variations in the supply voltage from 1.3 V to 1.8 V, achieving higher average gain and the measured blind zone of 3 ps, which is around five times less than earlier reported works. Also, the proposed selective reset techniques are used to design the PFD-LID. Both the PFDs and PFD-LID are validated using the traditional phase-locked loop (PLL) architecture by achieving minimal settling time of the PLL.
机译:在本文中,提出了两个相位频率检测器(PFD)架构和具有锁定检测(PFD-LID)的PFD,其使用新技术设计用于选择性地重置输出以实现具有下盲区域的改善的平均增益。 使用180nm CMOS工艺设计和制造两种提出的PFD。 该电路与电源电压的变化从1.3V到1.8V测试,实现更高的平均增益和3 PS的测量盲区,比早于前面的报告的作品大约五倍。 此外,所提出的选择性复位技术用于设计PFD-盖子。 通过实现PLL的最小沉降时间,使用传统的锁相环(PLL)架构来验证PFD和PFD-LID。

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