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Multi-step electron beam technology for the fabrication of high performance diffractive optical elements

机译:用于制造高性能衍射光学元件的多步电子束技术

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摘要

Optical performance, i.e. the diffraction efficiency, numerical aperture and wave front quality is of great importance for further successful application of diffractive optical elements in a wide range of research and commercial applications. For the fabrication process, simultaneously large numerical aperture and high diffraction efficiency result in a pattern with sub-wavelength resolution and a multi-level phase profile of nanometer accuracy. To fulfill such high requirements, a multi-step fabrication technique is proposed, in which the electron beam is used both for pattern writing and layout alignment. This method enables the fabrication of a structure with the L = 2~n discrete phase levels in n sequential lithographic steps. In each step, the pattern written in a thin, high contrast resist layer is transferred after development into the substrate by reactive ion etching to form the phase profile. In comparison to the multi-mask binary optics technology, the proposed method offers a higher resolution and reduces the alignment errors to insignificant values. On the other hand, in comparison to the direct write analog technique, our approach allows for a much better control of the phase profile and ensures larger process tolerances. The method has been successfully applied in the fabrication of several types of diffractive elements, including micro-Fresnel lens arrays, phase sampling filters and diffraction gratings on quartz and GaAs wafers. The diffraction efficiencies of these elements were found to be up to 92%. The lens exhibited diffraction-limited focusing characteristics and an insignificant wave front aberration (rms 0.01 λ).
机译:光学性能,即衍射效率,数值孔径和波阵面质量对于在各种研究和商业应用中进一步成功地应用衍射光学元件至关重要。对于制造过程,同时大的数值孔径和高的衍射效率导致图案具有亚波长分辨率和纳米精度的多级相位分布。为了满足这样的高要求,提出了一种多步骤制造技术,其中将电子束用于图案写入和布局对准。该方法使得能够在n个连续光刻步骤中制造具有L = 2〜n个离散相水平的结构。在每个步骤中,写在薄的高对比度抗蚀剂层中的图案在显影后通过反应性离子蚀刻转移到基板中以形成相轮廓。与多掩模二元光学技术相比,所提出的方法提供了更高的分辨率,并将对准误差减小到无关紧要的值。另一方面,与直接写入模拟技术相比,我们的方法可以更好地控制相位分布并确保更大的工艺公差。该方法已成功应用于几种类型的衍射元件的制造中,包括微菲涅耳透镜阵列,相位采样滤光片和石英和GaAs晶圆上的衍射光栅。发现这些元素的衍射效率高达92%。该透镜具有衍射极限聚焦特性,并且波前像差不明显(rms 0.01λ)。

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