Effect of margin widths on the residual stress in a multi-layer ceramic capacitor

摘要

The influence of margin widths on the evolution of residual stress components in a multilayer ceramic capacitor has been investigated numerically by systematically varying the widths of the housing and lateral margins. As for the in-plane residual stress components (com-pressive), σ_(11) is much relieved by the housing margin which exists along the length (axis 1) direction, while σ_(22) is much relieved by the lateral margin which exists along the width (axis 2) direction. The out-of-plane stress component σ_(33) (tensile) increases via both the housing and lateral margins within the range of the critical width (about 150 μm), beyond which σ_(33) is not markedly influenced by the widths of margins.