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首页> 外文期刊>Microelectronic Engineering >Growth Ambient On Memory Characteristics In Au Nanoclusters Embedded In High-k Dielectric As Novel Non-volatile Memory
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Growth Ambient On Memory Characteristics In Au Nanoclusters Embedded In High-k Dielectric As Novel Non-volatile Memory

机译:作为新型非易失性存储器的高k电介质中嵌入的金纳米团簇的存储特性的生长环境

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摘要

In this work, we report on the findings of the effects of different ambient on memory characteristics of a floating gate memory structure containing HfAlO control gate, self-organized Au nanoclusters (NCs), and a HfAlO tunnel layer deposited by the pulsed-laser deposition. The optimized fabrication environment has been found and stored charge density up to 10~(13) cm~(-2) has been achieved. As the sizes of the Au NCs are smaller than 4 nm, they may be potentially used in multilayer-structured multi-bit memory cell.
机译:在这项工作中,我们报告了不同环境对包含HfAlO控制栅,自组织Au纳米团簇(NCs)和通过脉冲激光沉积沉积的HfAlO隧道层的浮栅存储结构的存储特性的影响的发现结果。 。找到了优化的制造环境,并获得了高达10〜(13)cm〜(-2)的存储电荷密度。由于Au NC的尺寸小于4nm,它们可能潜在地用于多层结构的多位存储单元中。

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