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首页> 外文期刊>Microelectronic Engineering >Transferring of GaAs microtips using selective wet etching Al_(0.7)Ga_(0.3)As sacrificial layer
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Transferring of GaAs microtips using selective wet etching Al_(0.7)Ga_(0.3)As sacrificial layer

机译:使用选择性湿法刻蚀Al_(0.7)Ga_(0.3)As牺牲层转移GaAs微尖端

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摘要

GaAs pyramidal microtips were successfully transferred from GaAs substrate to target wafer by a simple technique, i.e., selective wet etching off AlGaAs sacrificial layer. A GaAs/Al_(0.7)Ga_(0.3)As/GaAs sandwich structure is firstly formed on GaAs (001) substrate by metalorganic chemical vapor deposition, and then GaAs pyramidal microtips are grown on the sandwich structure using selective liquid-phase epitaxy. The GaAs microtips are removed from the sandwich structure by selective wet etching Al_(0.7)Ga_(0.3)As layer using concentrated HCl solution. Finally, the tips are glued onto the target wafer by a negative photoresist. During this transfer process the tips are completely encapsulated in a positive photoresist to protect against attack. Scanning electron microscopy images show that GaAs tips can be successfully transferred without any damage by this technique. The achievement reported here represents a significant step towards the application of scanning near-field optical microscopy.
机译:通过简单的技术,即选择性湿法刻蚀掉AlGaAs牺牲层,成功地将GaAs金字塔形微尖端从GaAs衬底转移到目标晶片。首先通过金属有机化学气相沉积在GaAs(001)衬底上形成GaAs / Al_(0.7)Ga_(0.3)As / GaAs夹心结构,然后使用选择性液相外延在该夹心结构上生长GaAs金字塔微尖端。通过使用浓盐酸溶液选择性湿法腐蚀Al_(0.7)Ga_(0.3)As层,从夹层结构中去除GaAs微尖端。最后,通过负性光刻胶将尖端粘合到目标晶片上。在此转移过程中,尖端被完全封装在正性光刻胶中,以防止受到侵蚀。扫描电子显微镜图像显示,该技术可以成功转移GaAs尖端,而不会造成任何损坏。此处报道的成就代表了扫描近场光学显微镜应用的重要一步。

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